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Applied Scanning Probe Methods XI

J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM.- E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Senso...

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